Electrical Atomic Force Microscopy for Nanoelectronics NanoScience and Technology Editat de Umberto Celano 25 aug 2020 Paperback Preț: 1070.87 lei 1305.95 lei 43-57 zile -18%
Metrology and Physical Mechanisms in New Generation Ionic Devices Springer Theses Autor Umberto Celano 7 iun 2018 Paperback Preț: 611.12 lei 718.97 lei 43-57 zile -15%