Surface Analysis - The Principal Techniques 3e
Editat de Ian S. Gilmore, John C. Vickermanen Limba Engleză Hardback – 22 oct 2026
Analyzing the composition of a given surface is a crucial aspect of materials and biomedical sciences, with significant bearing on the way a material will interact with a particular environment or mapping molecules in tissue with sub-cellular resolution. Surface analysis draws upon a substantial body of research to analyze the outer few nanometres of a material and buried interface with nanometre resolution. It has considerable significance in laboratories studying corrosion, adhesion, polymer surface treatment, semiconductors, medical devices and drug delivery.
Surface Analysis offers a comprehensive and accessible overview of the characterization and analysis of surface and buried layers. It brings together experts in each analysis area to lay out foundational theory, offer practical applications, and provide examples. Now fully up to date and reflecting the latest research, it is a must-own for any scientist incorporating surface analysis into laboratory work.
Readers of the third edition of Surface Analysis will also find:
- Two new chapters on advanced mass spectrometry methods
- Detailed coverage of ever-more-important methods of data analysis
- Tools for concretely improving laboratory and research outcomes
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Specificații
ISBN-13: 9781394244546
ISBN-10: 1394244541
Pagini: 576
Ediția:3. Auflage
Editura: John Wiley & Sons, Inc.
ISBN-10: 1394244541
Pagini: 576
Ediția:3. Auflage
Editura: John Wiley & Sons, Inc.
Notă biografică
JOHN C. VICKERMAN, PhD, DSc, FRSC, is Professor Emeritus at the University of Manchester. He got his PhD in Surface Chemistry at the University of Bristol and held postdoctoral fellowships at the University of Bristol, the Technical University of Eindhoven, and sabbatical Alexander von Humboldt Fellowships at the Universities of Munich and Berlin. He is known as a pioneer and international leader in the development of surface analysis by secondary ion mass spectrometry (SIMS), in recognition of which he received the Theophilus Redwood Award from the Royal Society of Chemistry and the Médaille Chevenard medal of the Société Française de Métallurgie et de Matériaux.
IAN S. GILMORE, PhD, FMedSci, is a Senior Fellow at the National Physical Laboratory in Teddington, UK and visiting Professor at the University of Nottingham. He is known for breakthroughs in high-resolution molecular imaging by mass spectrometry. More recently. he innovated a quantum detector boosting the sensitivity of high-resolution mass spectrometers by an order of magnitude. He was elected a Fellow of the Academy of Medical Sciences in 2023 and is the recipient of the Medard W. Welch Award from the American Vacuum Society.
IAN S. GILMORE, PhD, FMedSci, is a Senior Fellow at the National Physical Laboratory in Teddington, UK and visiting Professor at the University of Nottingham. He is known for breakthroughs in high-resolution molecular imaging by mass spectrometry. More recently. he innovated a quantum detector boosting the sensitivity of high-resolution mass spectrometers by an order of magnitude. He was elected a Fellow of the Academy of Medical Sciences in 2023 and is the recipient of the Medard W. Welch Award from the American Vacuum Society.
Cuprins
List of Contributors xi
Preface xiii
1 Introduction 1
John C. Vickerman
1.1 How Do We Define the Surface? 1
1.2 How Many Atoms in a Surface? 2
1.3 Information Required 2
1.4 Surface Sensitivity 3
1.5 Radiation Effects - Surface Damage 5
1.6 Complexity of the Data 6
2 Electron Spectroscopy for Chemical Analysis 7
Buddy D. Ratner, Lara J. Gamble, and David G. Castner
2.1 Overview 7
2.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids 9
2.3 Binding Energy and the Chemical Shift 11
2.4 Inelastic Mean Free Path and Sampling Depth 19
2.5 Quantification 21
2.6 Spectral Features 26
2.7 Instrumentation 31
2.8 Spectral Quality 37
2.9 Depth Profiling 38
2.10 X-Y Mapping and Imaging 41
2.11 Chemical Derivatization 43
2.12 Valence Band 44
2.13 Nanoparticle Characterization 45
2.14 Perspectives 46
2.15 Conclusions 47
3 Molecular Surface Mass Spectrometry by Secondary Ion Mass Spectrometry (SIMS) 55
Hua Tian and John C. Vickerman
3.1 Introduction 55
3.2 Basic Concepts 57
3.3 Experimental Requirements 64
3.4 Secondary Ion Formation 77
3.5 Modes of Analysis 88
3.6 Future Outlook 116
4 SIMS for Semiconductors 125
Wilfried Vandervorst, Claudia Fleischmann, and Andrew Budrevich
4.1 Introduction 128
4.2 General Aspects of SIMS 131
4.3 Basic Processes of SIMS 136
4.4 Profile Shape 170
4.5 Conclusions 216
5 Mass Spectrometry Imaging 225
Rory T. Steven and Josephine Bunch
5.1 Introduction and Condensed History of MSI 225
5.2 Sample Preparation for MSI 227
5.3 Production of an Image in MSI - Key Concepts 232
5.4 Key Modalities in MSI 236
5.5 Quantitation in MSI 246
5.6 Data Analysis in MSI 247
5.7 Notable Applications 249
5.8 Current and Future Perspectives 249
6 Scattering Spectroscopies and Related Techniques 267
Edmund Taglauer and Roger P. Webb
6.1 Introduction 267
6.2 Scattering Spectroscopies 268
6.3 Related Techniques 310
6.4 Conclusions 322
7 Vibrational Spectroscopy from Surfaces 329
Peter Gardner and Natalie Belsey
7.1 Introduction 329
7.2 Infrared Spectroscopy from Surfaces 330
7.3 Electron Energy Loss Spectroscopy (EELS) 351
7.4 The Group Theory of Surface Vibrations 357
7.5 LASER Raman Spectroscopy from Surfaces 361
7.6 Inelastic Neutron Scattering (INS) 368
7.7 Sum-Frequency Generation Methods 370
8 Surface Structure Determination by Interference Techniques 375
Christopher A. Lucas and Yvonne Grunder
8.1 Introduction 375
8.2 Electron Diffraction Techniques 383
8.3 X-ray Techniques 399
8.4 Photoelectron Diffraction 428
9 Scanning Probe Techniques 441
Graham J. Leggett
9.1 Introduction 441
9.2 Scanning Tunnelling Microscopy 442
9.3 Atomic Force Microscopy 462
9.4 Optical Microscopy and Spectroscopy at the Nanometre Scale 487
9.5 Conclusions 495
10 The Application of Machine Learning to Surface Analysis Data 503
Gustavo F. Trindade
10.1 Introduction 503
10.2 Basic Concepts 504
10.3 Data Preprocessing 506
10.4 Unsupervised Learning Methods 508
10.5 Supervised Learning Methods 530
10.6 Summary and Conclusion 541
Acknowledgements 541
References 541
Problems 544
Appendix Units, Fundamental Physical Constants and Conversions 547
A.1 Base Units of the SI 547
A.2 Fundamental Physical Constants 547
A.3 Other Units and Conversions to SI 547
References 548
Index 551
Preface xiii
1 Introduction 1
John C. Vickerman
1.1 How Do We Define the Surface? 1
1.2 How Many Atoms in a Surface? 2
1.3 Information Required 2
1.4 Surface Sensitivity 3
1.5 Radiation Effects - Surface Damage 5
1.6 Complexity of the Data 6
2 Electron Spectroscopy for Chemical Analysis 7
Buddy D. Ratner, Lara J. Gamble, and David G. Castner
2.1 Overview 7
2.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids 9
2.3 Binding Energy and the Chemical Shift 11
2.4 Inelastic Mean Free Path and Sampling Depth 19
2.5 Quantification 21
2.6 Spectral Features 26
2.7 Instrumentation 31
2.8 Spectral Quality 37
2.9 Depth Profiling 38
2.10 X-Y Mapping and Imaging 41
2.11 Chemical Derivatization 43
2.12 Valence Band 44
2.13 Nanoparticle Characterization 45
2.14 Perspectives 46
2.15 Conclusions 47
3 Molecular Surface Mass Spectrometry by Secondary Ion Mass Spectrometry (SIMS) 55
Hua Tian and John C. Vickerman
3.1 Introduction 55
3.2 Basic Concepts 57
3.3 Experimental Requirements 64
3.4 Secondary Ion Formation 77
3.5 Modes of Analysis 88
3.6 Future Outlook 116
4 SIMS for Semiconductors 125
Wilfried Vandervorst, Claudia Fleischmann, and Andrew Budrevich
4.1 Introduction 128
4.2 General Aspects of SIMS 131
4.3 Basic Processes of SIMS 136
4.4 Profile Shape 170
4.5 Conclusions 216
5 Mass Spectrometry Imaging 225
Rory T. Steven and Josephine Bunch
5.1 Introduction and Condensed History of MSI 225
5.2 Sample Preparation for MSI 227
5.3 Production of an Image in MSI - Key Concepts 232
5.4 Key Modalities in MSI 236
5.5 Quantitation in MSI 246
5.6 Data Analysis in MSI 247
5.7 Notable Applications 249
5.8 Current and Future Perspectives 249
6 Scattering Spectroscopies and Related Techniques 267
Edmund Taglauer and Roger P. Webb
6.1 Introduction 267
6.2 Scattering Spectroscopies 268
6.3 Related Techniques 310
6.4 Conclusions 322
7 Vibrational Spectroscopy from Surfaces 329
Peter Gardner and Natalie Belsey
7.1 Introduction 329
7.2 Infrared Spectroscopy from Surfaces 330
7.3 Electron Energy Loss Spectroscopy (EELS) 351
7.4 The Group Theory of Surface Vibrations 357
7.5 LASER Raman Spectroscopy from Surfaces 361
7.6 Inelastic Neutron Scattering (INS) 368
7.7 Sum-Frequency Generation Methods 370
8 Surface Structure Determination by Interference Techniques 375
Christopher A. Lucas and Yvonne Grunder
8.1 Introduction 375
8.2 Electron Diffraction Techniques 383
8.3 X-ray Techniques 399
8.4 Photoelectron Diffraction 428
9 Scanning Probe Techniques 441
Graham J. Leggett
9.1 Introduction 441
9.2 Scanning Tunnelling Microscopy 442
9.3 Atomic Force Microscopy 462
9.4 Optical Microscopy and Spectroscopy at the Nanometre Scale 487
9.5 Conclusions 495
10 The Application of Machine Learning to Surface Analysis Data 503
Gustavo F. Trindade
10.1 Introduction 503
10.2 Basic Concepts 504
10.3 Data Preprocessing 506
10.4 Unsupervised Learning Methods 508
10.5 Supervised Learning Methods 530
10.6 Summary and Conclusion 541
Acknowledgements 541
References 541
Problems 544
Appendix Units, Fundamental Physical Constants and Conversions 547
A.1 Base Units of the SI 547
A.2 Fundamental Physical Constants 547
A.3 Other Units and Conversions to SI 547
References 548
Index 551