Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications Springer Series in Materials Science, nr. 85 Autor Stefan Rein 19 oct 2010 Paperback Preț: 1755.09 lei 2140.35 lei 6-8 săpt. -18%
Star Trek - Rezeptionsverhalten bei einem Fernsehphänomen Autor Stefan Rein 31 oct 2010 Paperback Preț: 81.73 lei Indisponibil temporar