Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques, Volume 240 in the Advances in Imaging and Electron Physics series, continues the tradition of this long-standing publication in presenting authoritative reviews and advances in imaging science and electron physics. The series merges two influential serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy—and covers topics spanning electron device physics, particle optics, microlithography, image science, digital image processing, electromagnetic wave propagation, and electron microscopy.

This volume focuses on the development and applications of the Sparse-Dirac super-resolution (S-Dirac SR) method for high-resolution transmission electron microscopy (HRTEM). Chapters present the historical context and motivations behind the method, followed by discussions of its physical principles, mathematical framework, and algorithmic implementation. Additional sections compare the S-Dirac approach with other state-of-the-art techniques and explore its practical applications in high-resolution electron microscopy. The volume concludes with perspectives on future developments and potential directions in super-resolution imaging methods.

• Provides an in-depth exploration of the Sparse-Dirac super-resolution (S-Dirac SR) method for high-resolution transmission electron microscopy
• Presents the physical principles, mathematical frameworks, and algorithmic implementation of a modern super-resolution imaging technique
• Includes comparisons with other state-of-the-art imaging and reconstruction approaches
• Explores practical applications of super-resolution methods in advanced electron microscopy
• Serves as a valuable reference for researchers in imaging science, electron microscopy, and computational imaging