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Cărți de Souvik Mahapatra

Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling

Springer Series in Advanced Microelectronics, nr. 52

Editat de Souvik Mahapatra

23 oct 2016

Preț: 604^.08 lei 755^.10 lei

38-44 zile

-20%

Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact

Editat de Souvik Mahapatra

27 noi 2022

Preț: 909^.67 lei 1109^.36 lei

6-8 săpt.

-18%