Reliability of Microtechnology
Autor Johan Liu, Olli Salmela, Jussi Sarkka, James E Morris, Per-Erik Tegehall, Cristina Anderssonen Limba Engleză Hardback – 14 feb 2011
The book also includes exercises and detailed solutions at the end of each chapter.
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Specificații
ISBN-13: 9781441957597
ISBN-10: 1441957596
Pagini: 204
Ilustrații: XIII, 204 p.
Dimensiuni: 162 x 241 x 23 mm
Greutate: 0.48 kg
Ediția:2011 edition
Editura: Springer
Locul publicării:New York, NY, United States
ISBN-10: 1441957596
Pagini: 204
Ilustrații: XIII, 204 p.
Dimensiuni: 162 x 241 x 23 mm
Greutate: 0.48 kg
Ediția:2011 edition
Editura: Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Introduction to Reliability and its Importance.- Reliability Metrology.- General Failure Mechanisms of Microsystems.- Solder and Conductive Adhesive Joint Reliability.- Accelerated Testing.- Reliability Design for Manufacturability.- Component Reliability.- System Level Reliability.- Reliability and Quality Management of Microsystem.- Experimental Tools for Reliability Analysis.
Textul de pe ultima copertă
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also:
- Discusses the general failure mechanisms of microsystems on a component level
- Offers comprehensive coverage of solder joint reliability at the microsystems level
- Analyzes�quality issues and manufacturing at the microsystems level
Caracteristici
Discusses the general failure mechanisms of microsystems on a component level Comprehensive coverage of solder joint reliability at the microsystems level Includes accelerated testing of solder joints at the microsystems level Discusses quality issues and manufacturing at the microsystems level Includes supplementary material: sn.pub/extras