This book addresses process variability and power management for embedded memories, which are becoming dominant components in today’s Systems on Chip (SoCs).  It provides thorough background on voltage scaling and the reliability effects on memories, while describing memory behavior at different voltages and frequencies. The authors describe a cross-layer approach, simultaneously targeting the manufacturing of devices, the inner-design of the memory circuits, as well as the way they are architected into a system.  This approach enables the design of reliable, power-efficient systems in which memories are dominating area, power, and performance.