Cărți de J. Giber

Secondary Ion Mass Spectrometry SIMS III

Springer Series in Chemical Physics, nr. 19

Editat de A. Benninghoven et al.

26 iul 2012

Preț: 627^.14 lei 737^.81 lei

43-57 zile

-15%

Defect Complexes in Semiconductor Structures

Editat de J. Giber et al.

feb 1983

Preț: 647^.36 lei 761^.60 lei

43-57 zile

-15%

New Developments in Semiconductor Physics

Editat de F. Beleznay et al.

mai 1980

Preț: 393^.36 lei

43-57 zile