Interferometry Principles & Applications
Editat de Mark E Russoen Limba Engleză Hardback – apr 2011
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Specificații
ISBN-13: 9781612093475
ISBN-10: 1612093477
Pagini: 572
Ilustrații: illustrations
Dimensiuni: 260 x 180 x 36 mm
Greutate: 1.24 kg
Editura: Nova Science Publishers Inc
Colecția Nova Science Publishers, Inc (US)
Locul publicării:United States
ISBN-10: 1612093477
Pagini: 572
Ilustrații: illustrations
Dimensiuni: 260 x 180 x 36 mm
Greutate: 1.24 kg
Editura: Nova Science Publishers Inc
Colecția Nova Science Publishers, Inc (US)
Locul publicării:United States
Cuprins
Preface; Speckle Methods for Material Analysis; The Production & Accurate Measurement of a 1 Millimeter Step Standard Using a Commercial & a Laboratory White Light Interferometer; Cyclic Path Interferometric Configuration: Some Applications; Single-Shot Phase-Grating Phase-Shifting Interferometry; SAR Interferometry Fundamentals & Historic Evolution in Terrain Movements Applications; High Contrast Schlieren Diffraction Interferometry; Binary Grating Interferometry with Two Windows; Electronic Speckle Pattern Interferometry: Principles & Applications; Periodic Error Measurement for Heterodyne Interferometry; Maximum Likelihood Estimation of Optical Signal Parameters; Phase-Stepping Algorithms: Overview & Simulations; Generalized Carre Multi-Step Phase-Shifting Algorithms.