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Infrared Characterization for Microelectronics

Autor Wai Shing Lau
en Limba Engleză Hardback – 4 oct 1999
The focus of this text is on practical applications of infrared characterization useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement is discussed in detail.
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Specificații

ISBN-13: 9789810223526
ISBN-10: 9810223528
Pagini: 172
Dimensiuni: 162 x 227 x 19 mm
Greutate: 0.37 kg
Editura: World Scientific Publishing Company