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Failure Analysis: De Gruyter STEM

Autor Eric J. Carleton, Daniel J. D. Sullivan
en Limba Engleză Paperback – 24 oct 2022
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
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Specificații

ISBN-13: 9781501524783
ISBN-10: 150152478X
Pagini: 130
Ilustrații: 20 b/w and 65 col. ill., 10 b/w tbl.
Dimensiuni: 170 x 240 x 9 mm
Greutate: 0.26 kg
Ediția:1. Auflage
Editura: De Gruyter
Colecția de Gruyter Stem
Seria De Gruyter STEM


Notă biografică

Dr. Daniel J. D. Sullivan
attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection.
Dr. Eric J. Carleton
is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.