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Energy-Filtering Transmission Electron Microscopy de Ludwig Reimer

Energy-Filtering Transmission Electron Microscopy: Springer Series in Optical Sciences, cartea 71

Editat de Ludwig Reimer
en Limba Engleză Paperback – 13 noi 2013
Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.
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Specificații

ISBN-13: 9783662140550
ISBN-10: 3662140551
Pagini: 440
Ilustrații: XIII, 425 p. 157 illus.
Dimensiuni: 155 x 235 x 24 mm
Greutate: 0.66 kg
Ediția:Softcover reprint of the original 1st ed. 1995
Editura: Springer
Colecția Springer Series in Optical Sciences
Seria Springer Series in Optical Sciences

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

1. Introduction.- 2. Electron Optics of Imaging Energy Filters.- 3. Plasmons and Related Excitations.- 4. Inner-Shell Ionization.- 5. Quantitative Electron Energy-Loss Spectroscopy.- 6. Electron Spectroscopic Diffraction.- 7. Electron Spectroscopic Imaging.- 8. Energy-Filtered Reflection Electron Microscopy.

Recenzii

"This book gives an excellent introduction to the topic...and can be advised both as a text book for researchers new in this field as well as those looking for a basic reference to the topic." - Physicalia

Textul de pe ultima copertă

Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument.