Efficient Test Data Compression and Fault Analysis in VLSI Circuits
Autor Sivaganesan Subramaniamen Limba Engleză Paperback – 30 mai 2019
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Specificații
ISBN-13: 9786138834304
ISBN-10: 6138834305
Pagini: 84
Dimensiuni: 150 x 220 x 6 mm
Greutate: 0.14 kg
Editura: Scholars' Press
ISBN-10: 6138834305
Pagini: 84
Dimensiuni: 150 x 220 x 6 mm
Greutate: 0.14 kg
Editura: Scholars' Press
Notă biografică
Sivaganesan S Received B.E in Electronics and Communication Engineering from VSB Engineering College, Karur and M.E in VLSI Design from Karpagam College of Engineering, Coimbatore, Presently Working as Assistant Professor in KIT-Kalaignarkarunanidhi Institute of Technology, Coimbatore. Published more number of papers in International level Journals