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Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy de H. -H Kausch

Characterization of Polymers in the Solid State II: Synchrotron Radiation, X-ray Scattering and Electron Microscopy: Advances in Polymer Science, cartea 67

Editat de H. -H Kausch Contribuţii de G. Bodor Editat de H.G. Zachmann Contribuţii de G. Elsner, J. Hendrix, L. Monnerie, C. Riekel, H.B. Stuhrmann, J.-L. Viovy, I.G. Voigt-Martin
en Limba Engleză Paperback – 3 oct 2013

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Specificații

ISBN-13: 9783662159668
ISBN-10: 366215966X
Pagini: 252
Ilustrații: XI, 236 p. 73 illus.
Dimensiuni: 170 x 244 x 13 mm
Greutate: 0.41 kg
Ediția:Softcover reprint of the original 1st ed. 1985
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Advances in Polymer Science

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

Synchrotron radiation in polymer science.- Position sensitive X-ray detectors.- Fluorescence Anisotropy technique using Synchrotron Radiation as a powerful means for studying the orientation correlation functions of polymer chains.- Resonance scattering in macromolecular structure research.- X-ray line shape analysis. A means for the characterization of crystalline polymers.- Use of transmission electron microscopy to obtain quantitative information about polymers.