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Atomic Force Microscopy and Atomic Manipulation

Autor Franz J. Gießibl
en Limba Engleză Hardback – 24 sep 2026

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Specificații

ISBN-13: 9783032322012
ISBN-10: 3032322014
Pagini: 380
Dimensiuni: 160 x 241 x 26 mm
Greutate: 0.68 kg
Editura: Springer

Notă biografică

Franz J. Giessibl was born in 1962. He has been gathering laboratory experience in laser optics since 1978, obtaining a Diploma at TU Munich in semiconductor physics in 1987. From 1988-1991 he undertook PhD studies with Nobel laureate Gerd Binnig on atomic force microscopy (AFM), and in 1992 was a postdoc with Binnig's group at IBM. From 1992-1994 he worked for a silicon valley startup company that builds AFMs and was involved in achieving the first atomic-resolution AFM results for silicon, which launched the field of noncontact AFM. Giessibl became a strategic management consultant with McKinsey from 1995-1996, during which time he invented and patented the qPlus sensor in his spare time. From 1997-2005 he undertook the habilitation at U. Augsburg, subsequently being offered chairs at Bristol and Regensburg. In 2006 he became professor in Regensburg. Franz J. Giessibl's previous works include: Contributed chapters to Springer books Nanotechnology (Bushan), Noncontact AFM Vol I (2002), Coedited books Noncontact AFM Vol II (2009) and Vol III (2015) with Morita, Meyer, Wiesendanger. He has also published the book "First View inside an Atom - Encounters with Gerhard Richter between Art and Science" Walther König Verlag Cologne (2022).