CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155 MRS Proceedings Editat de Alexander A. Demkov et al. 4 iun 2014 Paperback Preț: 221.83 lei 6-8 săpt.
Integration of Functional Oxides with Semiconductors Autor Agham B. Posadas et al. 3 sep 2016 Paperback Preț: 611.25 lei 764.07 lei 38-44 zile -20%