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Advances in X-Ray Analysis de I C Noyan

Advances in X-Ray Analysis

Autor I C Noyan, Gilfrich Editat de T C Huang, Charles C Goldsmith, J V Gilfrich, John V Gilfrich, C C Goldsmith, Ting C Huang, Ron Jenkins, I Cev Noyan
en Limba Engleză Hardback – oct 1994
Selected papers from the 1993 Denver Conference on Applications of X-Ray Analysis. International experts present the latest research in the field, with special coverage of the impact of personal computers and sophisticated software on the development of X-ray instrumentation and techniques. Annotati
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Specificații

ISBN-13: 9780306449017
ISBN-10: 0306449013
Pagini: 784
Dimensiuni: 183 x 260 x 48 mm
Greutate: 1.64 kg
Editura: Springer
Locul publicării:Boston, MA, United States

Public țintă

Research

Cuprins

89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.