Advances in X-Ray Analysis
Autor Gilfrich Editat de C R Hubbard, J V Gilfrich, T C Huang, John V Gilfrich, Ting C Huang, M R James, Ron Jenkins, G R LaChance, Deane K Smithen Limba Engleză Hardback – aug 1993
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Specificații
ISBN-13: 9780306445712
ISBN-10: 0306445719
Pagini: 712
Dimensiuni: 183 x 260 x 44 mm
Greutate: 1.51 kg
Ediția:New.
Editura: Springer
Locul publicării:Boston, MA, United States
ISBN-10: 0306445719
Pagini: 712
Dimensiuni: 183 x 260 x 44 mm
Greutate: 1.51 kg
Ediția:New.
Editura: Springer
Locul publicării:Boston, MA, United States
Public țintă
ResearchCuprins
Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.