Advances in X-Ray Analysis
Editat de Charles S Barrett, R. Ryon, Deane K Smith, J V Gilfrich, T C Huang, C S Barrett, John V Gilfrich, Ting C Huang, Ron Jenkins, G J McCarthy, Paul K Predeckien Limba Engleză Hardback – oct 1992
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Specificații
ISBN-13: 9780306442490
ISBN-10: 0306442493
Pagini: 648
Dimensiuni: 175 x 250 x 41 mm
Greutate: 1.28 kg
Editura: Springer
Locul publicării:Boston, MA, United States
ISBN-10: 0306442493
Pagini: 648
Dimensiuni: 175 x 250 x 41 mm
Greutate: 1.28 kg
Editura: Springer
Locul publicării:Boston, MA, United States
Public țintă
ResearchCuprins
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.