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Advances in Imaging & Electron Physics: Advances in Imaging and Electron Physics, cartea 238

Martin Hÿtch, Peter W. Hawkes
en Limba Engleză Hardback – iun 2026
Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
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Specificații

ISBN-13: 9780443471100
ISBN-10: 044347110X
Pagini: 258
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Cuprins

  • Preface
  • Numerical Methods for Computing Electrostatic and Magnetic Fields
  • Methods of Computing Optical Properties and Combating Aberrations for Low-Intensity Beams
  • Emittance and Brightness: Definitions and Measurements*
  • High-Resolution Scanning Transmission Low-Energy Ion Microscopes and Microanalyzers
  • High-Energy Ion Microprobes