Advances in Imaging & Electron Physics: Advances in Imaging and Electron Physics, cartea 238
Martin Hÿtch, Peter W. Hawkesen Limba Engleză Hardback – iun 2026
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
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Specificații
ISBN-13: 9780443471100
ISBN-10: 044347110X
Pagini: 258
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 044347110X
Pagini: 258
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Cuprins
- Preface
- Numerical Methods for Computing Electrostatic and Magnetic Fields
- Methods of Computing Optical Properties and Combating Aberrations for Low-Intensity Beams
- Emittance and Brightness: Definitions and Measurements*
- High-Resolution Scanning Transmission Low-Energy Ion Microscopes and Microanalyzers
- High-Energy Ion Microprobes