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Materials Reliability Issues in Microelectronics: Volume 225: MRS Proceedings

Editat de James R. Lloyd, Frederick G. Yost, Paul S. Ho
en Limba Engleză Hardback – 22 oct 1991
With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
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Specificații

ISBN-13: 9781558991194
ISBN-10: 1558991190
Pagini: 382
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.68 kg
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria MRS Proceedings

Locul publicării:New York, United States

Descriere

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.