Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale: NATO Science Series E:, cartea 333
Editat de R. Roseien Limba Engleză Paperback – 15 oct 2012
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.
| Toate formatele și edițiile | Preț | Express |
|---|---|---|
| Paperback (1) | 365.29 lei 43-57 zile | |
| SPRINGER NETHERLANDS – 15 oct 2012 | 365.29 lei 43-57 zile | |
| Hardback (1) | 372.15 lei 43-57 zile | |
| SPRINGER NETHERLANDS – 31 mar 1997 | 372.15 lei 43-57 zile |
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Specificații
ISBN-13: 9789401064149
ISBN-10: 9401064148
Pagini: 148
Ilustrații: X, 132 p.
Dimensiuni: 160 x 240 x 8 mm
Greutate: 0.22 kg
Ediția:Softcover reprint of the original 1st ed. 1997
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
ISBN-10: 9401064148
Pagini: 148
Ilustrații: X, 132 p.
Dimensiuni: 160 x 240 x 8 mm
Greutate: 0.22 kg
Ediția:Softcover reprint of the original 1st ed. 1997
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria NATO Science Series E:
Locul publicării:Dordrecht, Netherlands
Public țintă
ResearchCuprins
- Surface state electrons: transport through dangling bonds on Silicon, and scattering and confinement on metals.- - SFFM and SNOM of heterogeneous materials-.- - Synchrotron radiation spectromicroscopy: opportunities, limitations and data taking strategies.- - Scanning spectro-Microscopy with 250 to 800 eV X-rays-.- - Recent advances in LEEM/PEEM for structural and chemical analysis.- - Spectromicroscopy: some developments at BESSY.- - Shedding light on surface reactions PEEM, EMSI and RAM probed chemistry on solid surfaces.- - Subject Index.