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Advances in Imaging and Electron Physics (Advances in Imaging and Electron Physics, nr. 211)

Peter W. Hawkes, Martin Hÿtch
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en Limba Engleză Hardback – 12 Jul 2019
Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.


  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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Specificații

ISBN-13: 9780128174692
ISBN-10: 0128174692
Pagini: 320
Dimensiuni: 152 x 229 mm
Greutate: 0.6 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Cuprins

1. Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons Stephan Majert and Helmut Kohl 2. Reviewing the revised International System of Units (SI) Joaquín Valdés 3. Electron energy loss spectroscopy in the electron microscope Christian Colliex